• DocumentCode
    2696891
  • Title

    Impact of metal electrodes on the figure of merit (kt2·Q) and spurious modes of contour mode AlN resonators

  • Author

    Segovia-Fernandez, Jeronimo ; Nai-Kuei Kuo ; Piazza, Gianluca

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2012
  • fDate
    7-10 Oct. 2012
  • Firstpage
    299
  • Lastpage
    302
  • Abstract
    This paper presents an experimental study on the impact of the metal electrodes on the level of the first spurious mode, electromechanical coupling (kt2) and quality factor (Q) of laterally vibrating AlN contour mode resonators (CMRs). Pt, Ni, and Al are selected for the fabrication of the device top electrode since they exhibit a broad range of values of Young´s modulus, density and resistivity, which are the most relevant parameters that have an impact on the electromechanical characteristics of the device. The results on the level of the first spurious mode, and kt2 suggest that the acoustic mismatch between electrode and nonelectroded regions affect mostly these parameters. The extracted Q (after subtracting the effect of the electrode resistance) exhibits a trend in line with the theory of interfacial dissipation.
  • Keywords
    Young´s modulus; acoustic resonators; aluminium; aluminium compounds; elastic waves; electrical resistivity; electrodes; nickel; platinum; vibrations; Al; Al device top electrode; AlN; Ni; Ni device top electrode; Pt; Pt device top electrode; Young modulus; contour mode AlN resonators; contour mode resonators; density; device electromechanical characteristics; electromechanical coupling; first spurious mode; interfacial dissipation; laterally vibrating AlN CMR; metal electrode effects; quality factor; resistivity; resonator figure of merit; resonator spurious modes; Acoustics; Admittance; Electrodes; III-V semiconductor materials; Nickel; Resonant frequency; AlN contour mode resonator; electromechanical coupling; metal electrodes; quality factor; spurious modes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2012 IEEE International
  • Conference_Location
    Dresden
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-4561-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2012.0073
  • Filename
    6562532