DocumentCode
2697631
Title
Colored Random Projections for Compressed Sensing
Author
Wang, Zhongmin ; Arce, Gonzalo R. ; Paredes, Jose L.
Author_Institution
Dept. of Electr. & Comput. Eng., Delaware Univ., Newark, DE
Volume
3
fYear
2007
fDate
15-20 April 2007
Abstract
The emerging theory of compressed sensing (CS) has led to the remarkable result that signals having a sparse representation in some known basis can be represented (with high probability) by a small sample set, taken from random projections of the signal. Notably, this sample set can be smaller than that required by the ubiquitous Nyquist sampling theorem. Much like the generalized Nyquist sampling theorem dictates that the sampling rate can be further reduced for the representation of bandlimited signals, this paper points to similar results for the sampling density in CS. In particular, it is shown that if additional spectral information of the underlying sparse signals is known, colored random projections can be used in CS in order to further reduce the number of measurements needed. Such a priori information is often available in signal processing applications and communications. Algorithms to design colored random projection vectors are developed. Further, an adaptive CS sampling method is developed for applications where non-uniform spectral characteristics of the signal are expected but are not known a priori.
Keywords
image colour analysis; signal sampling; bandlimited signals; colored random projections; compressed sensing; nonuniform spectral characteristics; sampling density; spectral information; ubiquitous Nyquist sampling theorem; Colored noise; Compressed sensing; Density measurement; Iterative algorithms; Matching pursuit algorithms; Sampling methods; Signal processing algorithms; Signal reconstruction; Signal sampling; Spectral shape; Compressed sensing; colored noise; random projections; signal reconstruction; sparse signals;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech and Signal Processing, 2007. ICASSP 2007. IEEE International Conference on
Conference_Location
Honolulu, HI
ISSN
1520-6149
Print_ISBN
1-4244-0727-3
Electronic_ISBN
1520-6149
Type
conf
DOI
10.1109/ICASSP.2007.366819
Filename
4217849
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