Title :
Classification of Polarimetric SAR Images using the Degree of Polarization and the Co-Polarized Phase Difference
Author :
Oh, Yisok ; Chang, Geba
Author_Institution :
Dept. of Electron. Inf. & Commun. Eng., Hongik Univ., Seoul
Abstract :
A new polarimetric SAR image classification technique based on the degree of polarization (DoP) and the co-polarized phase-difference (CPD) is presented in this paper. Since the DoP and the CPD of a scattered wave provide information on the randomness of the scattering and the type of scattering mechanisms, at first, the statistics of the DoP and CPD are examined with measured polarimetric SAR image data. Then, a DoP-CPD diagram with appropriate boundaries between six different classes is developed based on the SAR image. The classification results are compared with the existing Entropy-alpha diagram as well as the JPL-AirSAR polarimetric data. The technique may have capability to classify an SAR image into six major classes; a bare surface, a village, a crown-layer short vegetation canopy, a trunk-layer short vegetation canopy, a crown-layer forest, and a trunk-dominated forest.
Keywords :
atmospheric boundary layer; geophysical techniques; image classification; polarisation; radar polarimetry; remote sensing by radar; synthetic aperture radar; vegetation; AIRborne Synthetic Aperture Radar; CPD; DoP; DoP-CPD diagram; JPL-AirSAR data; bare surface; co-polarized phase-difference; crown-layer forest; crown-layer short vegetation canopy; degree of polarization; entropy-alpha diagram; image classification technique; polarimetric SAR image; scattering mechanism; synthetic aperture radar; trunk-dominated forest; trunk-layer short vegetation canopy; village; Covariance matrix; Entropy; Image classification; Information analysis; Matrices; Polarization; Scattering parameters; Statistics; Stokes parameters; Vegetation mapping; DoP-CPD diagram; Polarimetric SAR image classification; co-polarized phase difference; degree of polarization;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4780103