Title :
Electronic failures in spacecraft environments
Author :
Sheldon, Douglas J.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper will provide a review of data describing electronic part failures in spacecraft environments. The details of the spacecraft environment and their individual contributions to the overall failure population will be described. The paper will also present an analysis of new data regarding electronic part failures during spacecraft assembly and test. This data provides an indication of incoming part level quality and insight into handling practices.
Keywords :
failure analysis; space vehicles; electronic part failures; incoming part level quality; spacecraft assembly; spacecraft environment; Aerospace electronics; Aircraft manufacture; Degradation; Failure analysis; Instruments; Ionizing radiation; Satellites; Single event upset; Space vehicles; Testing; component; electronic parts; failure; radiation; reliabiity; spacecraft;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488739
