Title :
The effects of switching noise on an oversampling A/D converter
Author :
Blalack, T. ; Wooley, B.A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
Abstract :
This paper presents the results of an experimental study of the effects of switching noise in a high-resolution oversampling /spl Sigma//spl Delta/ modulator. An experimental test circuit emulates the embedding of such a modulator in the same substrate as a large amount of active digital circuitry. The modulator is a third-order cascade comprising a second-order /spl Sigma//spl Delta/ stage followed by a first-order stage, both employing 1 b quantisation. A 1 /spl mu/m CMOS implementation of this design provides a dynamic range of more than 100 dB at digital audio bandwidths.
Keywords :
CMOS integrated circuits; cascade networks; integrated circuit noise; sigma-delta modulation; 1 b quantisation; 1 micron; A/D converter; CMOS technology; active digital circuitry; cascade circuit; digital audio bandwidth; dynamic range; oversampling /spl Sigma//spl Delta/ modulator; switching noise; Capacitance; Circuit noise; Clocks; Delay effects; Delta-sigma modulation; Noise figure; Noise level; Sampling methods; Semiconductor device noise; Switching converters;
Conference_Titel :
Solid-State Circuits Conference, 1995. Digest of Technical Papers. 41st ISSCC, 1995 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-2495-1
DOI :
10.1109/ISSCC.1995.535522
