• DocumentCode
    2698464
  • Title

    Ray Tracing for Simulating Reflection Phenomena in SAR Images

  • Author

    Auer, Stefan ; Hinz, Stefan ; Bamler, Richard

  • Author_Institution
    Remote Sensing Technol. (LMF), Tech. Univ. Munchen (TUM), Munich
  • Volume
    5
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    This paper presents an approach for using backward ray tracing for simulating radar reflectivity maps. After explaining the simulation concept which consists of three parts - modeling, sampling and image generation - two applications are presented for showing the performance of the simulator. At first reflection contributions like single or multiple bounce are simulated for a modeled building and compared to a real TerraSAR-X image. It shows how the capability of separating different bounce levels in different layers can support the interpretation of the SAR image. Afterwards reflection effects caused by quasi-perfect specular reflection are detected for another building model by means of geometrical analysis. This is thought as input for advanced Persistent Scatterer (PS) Analysis, since PS typically appear due to such reflection effects.
  • Keywords
    electromagnetic wave reflection; geophysical signal processing; image processing; ray tracing; reflectivity; remote sensing by radar; synthetic aperture radar; SAR images; TerraSAR-X imagery; afterwards reflection effects; backward ray tracing; bounce levels; image generation; persistent scatterer analysis; quasi-perfect specular reflection; radar reflectivity map; Analytical models; Layout; Light scattering; Light sources; Optical reflection; Optical scattering; Radar imaging; Radar scattering; Ray tracing; Solid modeling; Persistent Scatterers; Ray Tracing; SAR Simulation; TerraSAR-X;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4780143
  • Filename
    4780143