Title :
Photovoltaic (PV) cells characterization using advanced optical tools
Author :
Stellari, Franco ; Steen, Steven E. ; Fisher, Kathryn C. ; Shao, Xiaoyan
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
Abstract :
In this paper we investigate the use of advanced imaging characterization tools for photovoltaic (PV) cell characterization. These tools were originally developed for CMOS VLSI circuits and offer very high sensitivity and spatial resolution. Optical imaging of PV cells using different tools and techniques will be compared and discussed.
Keywords :
electroluminescence; optical images; photovoltaic cells; solar cells; CMOS VLSI circuits; advanced imaging characterization tools; advanced optical tools; electroluminescence; optical imaging; photovoltaic cell characterization; Circuit testing; Current measurement; Laser beams; Optical beams; Optical films; Optical imaging; Optical sensors; Photovoltaic systems; Solar power generation; Wavelength measurement; Electro-Luminescence; Laser Beam Induced Current (LBIC); Optical Beam Induced Resistance Change (OBIRCH); Photovoltaic;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488778
