DocumentCode
2698767
Title
Photovoltaic (PV) cells characterization using advanced optical tools
Author
Stellari, Franco ; Steen, Steven E. ; Fisher, Kathryn C. ; Shao, Xiaoyan
Author_Institution
T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
fYear
2010
fDate
2-6 May 2010
Firstpage
508
Lastpage
515
Abstract
In this paper we investigate the use of advanced imaging characterization tools for photovoltaic (PV) cell characterization. These tools were originally developed for CMOS VLSI circuits and offer very high sensitivity and spatial resolution. Optical imaging of PV cells using different tools and techniques will be compared and discussed.
Keywords
electroluminescence; optical images; photovoltaic cells; solar cells; CMOS VLSI circuits; advanced imaging characterization tools; advanced optical tools; electroluminescence; optical imaging; photovoltaic cell characterization; Circuit testing; Current measurement; Laser beams; Optical beams; Optical films; Optical imaging; Optical sensors; Photovoltaic systems; Solar power generation; Wavelength measurement; Electro-Luminescence; Laser Beam Induced Current (LBIC); Optical Beam Induced Resistance Change (OBIRCH); Photovoltaic;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4244-5430-3
Type
conf
DOI
10.1109/IRPS.2010.5488778
Filename
5488778
Link To Document