Title :
SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells
Author :
Meng, L. ; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G. ; Phang, J.C.H.
Author_Institution :
Centre for Integrated Circuit Failure Anal. & Reliability (CICFAR), Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways.
Keywords :
EBIC; acoustic microscopy; elemental semiconductors; grain boundaries; scanning electron microscopy; silicon; solar cells; EBIC studies; SEAM studies; electron beam induced current techniques; grain boundaries complementary information; polycrystalline solar cells electrical defects; polycrystalline solar cells morphological defects; scanning electron acoustic microscopy; Acoustic beams; Acoustic imaging; Acoustic signal detection; Acoustic waves; Blanking; Electron beams; Photovoltaic cells; Scanning electron microscopy; Silicon; Solar power generation; EBIC; Electron Beam; Induced Current; SEAM; Scanning Electron Acoustic Microscopy; electrical defects; morphological defects; solar cell;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488781
