Title :
Bidimensional empirical mode decomposition for biometric analysis and Iris recognition
Author :
Guaragnella, C. ; Manni, A. ; Palumbo, F. ; Politi, T.
Author_Institution :
Electrics & Electron. Dept., Politec. di Bari, Bari, Italy
Abstract :
A novel BEMD based Iris recognition system is presented. A multilayer processing for features extraction makes the system efficient. The use of geometrically described details information makes the iris signature very efficient in reducing false positive and false negatives occurrences. Preliminary results of the proposed algorithm seem to indicate BEMD can give high accuracy in iris recognition subsystems in comparison with other techniques.
Keywords :
feature extraction; iris recognition; bidimensional empirical mode decomposition; biometric analysis; features extraction; iris recognition system; multilayer processing; Data mining; Databases; Feature extraction; Humans; Image color analysis; Interpolation; Iris recognition; bidimensional; biometrics; empirical mode decomposition; features; iris recognition;
Conference_Titel :
Computational Intelligence for Measurement Systems and Applications (CIMSA), 2010 IEEE International Conference on
Conference_Location :
Taranto
Print_ISBN :
978-1-4244-7228-4
DOI :
10.1109/CIMSA.2010.5611761
