DocumentCode :
2698969
Title :
Reliability of microelectronics packaging in the era of EnergyWise and Borderless networks
Author :
Li, Li ; Xue, Jie
Author_Institution :
Technol. & Quality, Cisco Syst. Inc., San Jose, CA, USA
fYear :
2010
fDate :
2-6 May 2010
Firstpage :
440
Lastpage :
445
Abstract :
In an ever-increasingly connected world, the boundaries or obstacles to accessing information are being torn down by business necessity, personal preferences and technical innovations. The Borderless Network is creating the ability for customers to work anywhere, with any device using services and applications like video, collaboration, with a secure, reliable and seamless communication experience. The customer will also experience reduced energy consumption from network attached devices thanks to innovations made in the microelectronic devices, systems that enable the next generation of smart and EnergyWise networks. In this paper, challenges and opportunities in reliability of microelectronics packaging for the next generation of EnergyWise, Borderless networks will be reviewed. The impact of materials, manufacturing processes and field environmental conditions on the packaging reliability will be discussed with one case study.
Keywords :
integrated circuit packaging; integrated circuit reliability; Borderless networks; EnergyWise networks; manufacturing process; microelectronic device; microelectronics packaging reliability; network attached device; reduced energy consumption; secure communication; Computer networks; Costs; Energy consumption; Materials reliability; Microelectronics; Next generation networking; Packaging machines; Power system reliability; Technological innovation; Telecommunication network reliability; EnergyWise; low power design; microelectronics packaging; reliability; temperature and humidity effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4244-5430-3
Type :
conf
DOI :
10.1109/IRPS.2010.5488791
Filename :
5488791
Link To Document :
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