• DocumentCode
    2699353
  • Title

    Accumulation mode transistors for silicon-on-insulator circuits

  • Author

    MacElwee, T.W. ; Calder, I.D.

  • Author_Institution
    Northern Telecom Electron. Ltd., Ottawa, Ont., Canada
  • fYear
    1989
  • fDate
    3-5 Oct 1989
  • Firstpage
    171
  • Lastpage
    172
  • Abstract
    Summary form only given. Devices and circuits fabricated on thin fully depleted (FD) silicon-on-insulator (SOI) substrates should provide very high levels of performance for submicron circuits. The fully depleted transistor offers several advantages such as no kink effect, a reduction in the impact ionization effects and short-channel effects normally found in thick-film and bulk devices. In addition fully depleted transistors offer high carrier mobilities and an increase in transconductance. To obtain even higher performance particularly with respect to the P-channel transistor, an accumulation mode (AM) device has been used. The Operation of this device depends on the formation of an accumulation layer under the gate, as opposed to an inversion layer. Two-dimensional modeling and experimental data indicate that the AM transistor is a favored device for use in ULSI SOI circuits
  • Keywords
    CMOS integrated circuits; VLSI; accumulation layers; insulated gate field effect transistors; ion implantation; semiconductor device models; semiconductor-insulator boundaries; AM transistor; CMOS circuits; MOSFET; SIMOX; Si on insulator circuits; Si:O; ULSI SOI circuits; accumulation mode transistors; carrier mobilities; fully depleted transistor; impact ionization effects; kink effect; short-channel effects; submicron circuits; transconductance; two dimensional modelling; Circuits; Crystallization; Electrons; MOSFETs; Semiconductor films; Silicon on insulator technology; Substrates; Temperature; Transconductance; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOS/SOI Technology Conference, 1989., 1989 IEEE
  • Conference_Location
    Stateline, NV
  • Type

    conf

  • DOI
    10.1109/SOI.1989.69818
  • Filename
    69818