DocumentCode
2699353
Title
Accumulation mode transistors for silicon-on-insulator circuits
Author
MacElwee, T.W. ; Calder, I.D.
Author_Institution
Northern Telecom Electron. Ltd., Ottawa, Ont., Canada
fYear
1989
fDate
3-5 Oct 1989
Firstpage
171
Lastpage
172
Abstract
Summary form only given. Devices and circuits fabricated on thin fully depleted (FD) silicon-on-insulator (SOI) substrates should provide very high levels of performance for submicron circuits. The fully depleted transistor offers several advantages such as no kink effect, a reduction in the impact ionization effects and short-channel effects normally found in thick-film and bulk devices. In addition fully depleted transistors offer high carrier mobilities and an increase in transconductance. To obtain even higher performance particularly with respect to the P-channel transistor, an accumulation mode (AM) device has been used. The Operation of this device depends on the formation of an accumulation layer under the gate, as opposed to an inversion layer. Two-dimensional modeling and experimental data indicate that the AM transistor is a favored device for use in ULSI SOI circuits
Keywords
CMOS integrated circuits; VLSI; accumulation layers; insulated gate field effect transistors; ion implantation; semiconductor device models; semiconductor-insulator boundaries; AM transistor; CMOS circuits; MOSFET; SIMOX; Si on insulator circuits; Si:O; ULSI SOI circuits; accumulation mode transistors; carrier mobilities; fully depleted transistor; impact ionization effects; kink effect; short-channel effects; submicron circuits; transconductance; two dimensional modelling; Circuits; Crystallization; Electrons; MOSFETs; Semiconductor films; Silicon on insulator technology; Substrates; Temperature; Transconductance; Ultra large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
SOS/SOI Technology Conference, 1989., 1989 IEEE
Conference_Location
Stateline, NV
Type
conf
DOI
10.1109/SOI.1989.69818
Filename
69818
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