Title :
Photovoltaic module reliability studies at the Florida Solar Energy Center
Author :
Dhere, Neelkanth G. ; Pethe, Shirish A. ; Kaul, Ashwani
Author_Institution :
Florida Solar Energy Center, Univ. of Central Florida, Cocoa, FL, USA
Abstract :
The accelerated tests currently carried out on PV modules reduce the infant mortality as well as improve the production techniques during the manufacture of PV modules. However, they do not completely duplicate the real world operating conditions of PV modules. Hence it is essential to deploy PV modules in the field for extended period of time in order to estimate the degradation, if any, as well as to elucidate the degradation mechanisms. Moreover, PV modules should be tested by specially designed tests in harsh climates. In this paper some of the results obtained on a-Si:H modules from various US companies is discussed.
Keywords :
hydrogen; life testing; photovoltaic power systems; reliability; silicon; solar power stations; Florida; PV modules reliability; Si:H; US companies; infant mortality; photovoltaic module reliability; production techniques; solar energy center; Circuits; DH-HEMTs; Degradation; Leakage current; Life estimation; Photovoltaic systems; Solar energy; Solar power generation; Testing; Voltage; High Voltage Bias; PVUSA Regression; Photovoltaic; a-Si∶H;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488813
