Study of microwave Dielectric Resonator Oscillator long term frequency stability

Based on the frequency degradation information represented by internal state transition, this paper presents a degradation modeling framework and uses it to study the Dielectric Resonator Oscillator (DRO) long term frequency stability. Analysis of the factors influencing DRO frequency revealed that stress release in the microwave dielectric maybe play an important role in performance degradation of DRO. Then frequency degradation models are created and fitted by the degradation data coming from the Accelerated Degradation Test (ADT). The result indicates that the model significantly reflects the DRO practical degradation process with an impressively small sum of residuals.