DocumentCode :
2699841
Title :
Product failures: Power-law or exponential voltage dependence?
Author :
Haggag, Amr ; Forbes, Keith ; Anderson, Gary ; Burnett, Dave ; Abramowitz, Peter ; Moosa, Mohamed
Author_Institution :
Freescale Semicond., Austin, TX, USA
fYear :
2010
fDate :
2-6 May 2010
Firstpage :
125
Lastpage :
128
Abstract :
The product failures voltage acceleration has traditionally been modelled with exponential voltage dependence. However with voltage scaling, the voltage acceleration parameter (VAP) in an exponential model has increased as V-1 - as expected for dielectric breakdown in either back-end or front-end. This suggests an exponential model is probably quite conservative and a power-law model may be more appropriate for 90 nm and beyond. Even if an exponential model continues to be used, this understanding can help assess the amount of conservatism built in such a model.
Keywords :
electric breakdown; life testing; reliability; dielectric breakdown; exponential voltage dependence model; power-law dependence; product failure voltage acceleration; size 90 nm; voltage acceleration parameter; Acceleration; Breakdown voltage; Cost function; Dielectric breakdown; Failure analysis; Maintenance; Product design; Stress; Temperature dependence; Testing; TDDB; exponential; extrinsic; powerlaw; product; voltage acceleration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4244-5430-3
Type :
conf
DOI :
10.1109/IRPS.2010.5488840
Filename :
5488840
Link To Document :
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