DocumentCode
2699888
Title
System-level BIT false alarm reducing technology based on fault propagation analysis of complex system
Author
Zhao, Zhiao ; Qiu, Jing ; Liu, Guanjun ; Lv, Kehong ; Chun, Jing
Author_Institution
Coll. of Mechatron. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha, China
fYear
2012
fDate
15-18 June 2012
Firstpage
692
Lastpage
698
Abstract
In many complex electromechanical systems, fault propagation between nodes always leads system-level BIT false alarms. Therefore, this paper aims at reducing system-level BIT false alarms based on the research of small-world properties of fault propagation in large-scale systems. Firstly, find out community centers in the system which has small-world network properties, and then divide the system into several communities based on the improved Wu-Huberman algorithm. Subsequently, the hierarchical decomposition technology is used in the alarming community, to recognize system-level BIT false alarm according to the fault propagation influence degree between nodes. At last, the false alarm recognition performance of the method studied in this paper is validated by the application of a stabilized tracking platform system.
Keywords
built-in self test; fault diagnosis; large-scale systems; maintenance engineering; Wu-Huberman algorithm; built-in test; community centers; complex electromechanical systems; false alarm recognition performance; fault propagation analysis; fault propagation influence degree; hierarchical decomposition technology; large-scale systems; small-world network properties; stabilized tracking platform system; system-level BIT false alarm reducing technology; Communities; Educational institutions; Electromechanical systems; Large-scale systems; Matrix decomposition; Probability; Silicon; false alarm; fault propagation; hierarchical decomposition; small-world property; system-level BIT;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2012 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4673-0786-4
Type
conf
DOI
10.1109/ICQR2MSE.2012.6246325
Filename
6246325
Link To Document