DocumentCode
2699948
Title
Validating foundry technologies for extended mission profiles
Author
van Dijk, K. ; Volf, P.A.J. ; Detcheverry, C. ; Yau, A. ; Ngan, P. ; Liang, Z. ; Kuper, F.G.
Author_Institution
NXP Semicond., Nijmegen, Netherlands
fYear
2010
fDate
2-6 May 2010
Firstpage
111
Lastpage
116
Abstract
This paper presents a process qualification and characterization strategy that can extend the foundry process reliability potential to meet specific automotive mission profile requirements. In this case study, data and analyses are provided that lead to sufficient confidence for pushing the allowed mission profile envelope of a process towards more aggressive (automotive) applications.
Keywords
CMOS integrated circuits; integrated circuit reliability; CMOS process; automotive mission profile requirements; foundry process reliability; foundry technologies; process characterization strategy; process qualification; Automotive engineering; Data analysis; Foundries; Life testing; Performance evaluation; Qualifications; Robustness; Stress; Temperature distribution; Voltage; HTOL; SRAM Vddmin; guard band; ppm level; qualification strategy; test screens;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4244-5430-3
Type
conf
DOI
10.1109/IRPS.2010.5488845
Filename
5488845
Link To Document