• DocumentCode
    2700156
  • Title

    Detection of EEG changes via a generalized Itakura distance

  • Author

    Kong, Xuan ; Lou, Xuesong ; Thakor, Nitish V.

  • Author_Institution
    Dept. of Electr. Eng., Northern Illinois Univ., DeKalb, IL, USA
  • Volume
    4
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    1540
  • Abstract
    Changes in electroencephalograms (EEGs) carry important clinical information. The accurate detection and characterization of such changes in EEG can be a valuable tool for the clinical assessment of the neurological system condition. Autoregressive (AR) modes have previously been used to detect changes in the EEG signal. Based on the AR model parameters, an off-line distance measure called the Itakura distance (F. Itakura, 1975) has been used to effectively quantify changes in the EEG signal related to brain injury. The ordinary Itakura distance measure used for such quantification requires the same order for the AR models in all EEG segments. In this paper, a generalized Itakura distance measure is proposed without this constraint. The generalized measure is applied to the analysis of EEG signals. Preliminary results suggest that the generalized Itakura distance measure performs better for detecting injury-related changes in EEG
  • Keywords
    autoregressive processes; electroencephalography; medical signal detection; EEG segments; EEG signal analysis; autoregressive model parameters; brain injury; clinical information; electroencephalograms; generalized Itakura distance measure; injury-related EEG change detection; model order; neurological system condition; off-line distance measure; Biomedical engineering; Biomedical measurements; Brain injuries; Brain modeling; Clinical diagnosis; Electroencephalography; Frequency estimation; Signal analysis; Signal processing; Speech;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.757004
  • Filename
    757004