Title :
Simulation strategy after model checking: experience in industrial SOC design
Author :
Choi, Hoon ; Yun, Byeong-Whee ; Lee, Yun-Tae
Abstract :
There have been many works reporting the success of model checking in finding the bugs that are not detected by the simulation. On the contrary, in this paper, we show the bugs that can escape from the model checking, and present the simulation strategy and speed up techniques to detect those bugs. The main focus of this paper is to show clearly the importance and the role of a simulation as a complement to the model checking
Keywords :
logic design; logic simulation; industrial SOC design; model checking; simulation strategy; Assembly; Computer bugs; Control systems; Electronic mail; Electronics industry; Fabrication; Industrial electronics; Large scale integration; Reduced order systems; System testing;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2000. Proceedings. IEEE International
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-0786-7
DOI :
10.1109/HLDVT.2000.889563
