Title : 
Phonocardiogram classification using time-frequency representation
         
        
            Author : 
Shino, Hideaki ; Yoshida, Hisashi ; Mizuta, Hirohisa ; Yana, Kazuo
         
        
            Author_Institution : 
Dept. of Electron. Inf., Hosei Univ., Tokyo, Japan
         
        
        
        
            fDate : 
30 Oct-2 Nov 1997
         
        
        
            Abstract : 
Introduces a method for classifying systolic murmurs using the time-space representation of a phonocardiogram (PCG). The method detects the presence of systolic murmurs by a neural network utilizing variance sequences. Then, a wavelet transform is applied to that data classified as being related to a systolic murmur. A second neural network classifies the time-frequency distribution thus obtained into abnormal and benign murmurs. The proposed method was applied to data obtained from a nationwide phonocardiogram screening of elementary school children conducted in Japan. A correct decision rate of 98% was achieved for the first stage (detecting the presence of a systolic murmur). Correct classification rates for abnormal and benign murmurs were 78.6% and 84.5% respectively. The method could be useful in assisting medical doctors to make a final decision
         
        
            Keywords : 
echocardiography; medical signal processing; neural nets; paediatrics; signal classification; time-frequency analysis; Japan; abnormal murmurs; benign murmurs; correct decision rate; elementary school children; neural network; phonocardiogram classification; systolic murmur classification; time-frequency representation; time-space representation; variance sequences; wavelet transform; Artificial neural networks; Cities and towns; Educational institutions; Electrocardiography; Heart; Informatics; Neural networks; Pediatrics; Time frequency analysis; Wavelet transforms;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
         
        
            Conference_Location : 
Chicago, IL
         
        
        
            Print_ISBN : 
0-7803-4262-3
         
        
        
            DOI : 
10.1109/IEMBS.1997.757030