DocumentCode :
2700878
Title :
Visibility-based pursuit-evasion with probabilistic evader models
Author :
Stiffler, Nicholas M. ; Kane, Jason M O´
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
fYear :
2011
fDate :
9-13 May 2011
Firstpage :
4254
Lastpage :
4259
Abstract :
We propose an algorithm for a visibility-based pursuit-evasion problem in a simply-connected two-dimensional environment, in which a single pursuer has access to a probabilistic model describing how the evaders are likely to move in the environment. The application of our algorithm can be best viewed in the context of search and rescue: Although the victims (evaders) are not actively trying to escape from the robot, it is necessary to consider the task of locating the victims as a pursuit-evasion problem to obtain a firm guarantee that all of the victims are found. We present an algorithm that draws sample evader trajectories from the probabilistic model to compute a plan that lowers the Expected Time to Capture the evaders without drastically increasing the Guaranteed Time to Capture the evaders. We introduce a graph structure that takes advantage of the sampled evader trajectories to compute a path that would "see" all the evaders if they followed only those trajectories in our sampled set. We then use a previous technique to append our path with actions that provide a complete solution for the visibility-based pursuit evasion problem. The resulting plan guarantees that all evaders are located, even if they do not obey the given probabilistic motion model. We implemented the algorithm in a simulation and provide a quantitative comparison to existing methods.
Keywords :
graph theory; probability; robots; graph structure; probabilistic evader models; sample evader trajectories; visibility-based pursuit-evasion problem; Computational modeling; Context; Predictive models; Probabilistic logic; Robots; Search problems; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation (ICRA), 2011 IEEE International Conference on
Conference_Location :
Shanghai
ISSN :
1050-4729
Print_ISBN :
978-1-61284-386-5
Type :
conf
DOI :
10.1109/ICRA.2011.5980372
Filename :
5980372
Link To Document :
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