• DocumentCode
    2700961
  • Title

    Trace Element Effect On Tin-lead (60%-40%) Solder Wetting

  • Author

    Wu, Nianzu

  • fYear
    1993
  • fDate
    9-11 Jun 1993
  • Firstpage
    62
  • Lastpage
    65
  • Keywords
    Copper; Electronics industry; Gallium alloys; Gallium compounds; Impurities; Ovens; Production facilities; Surface cleaning; Surface treatment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International
  • Print_ISBN
    0-7803-1432-8
  • Type

    conf

  • DOI
    10.1109/IEMT.1993.639348
  • Filename
    639348