• DocumentCode
    2701159
  • Title

    On the 60 mV/dec @300 K limit for MOSFET subthreshold swing

  • Author

    Cheung, Kin P.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    The 60 mV/dec limit for subthreshold swing at 300 K is generally considered a fundamental limit that cannot be defeated. The physical origin of this limit is revisited in this paper and the fact that this limit is in part determined by the density-of-states (DOS) of the source is highlighted. A scheme of engineering this DOS is proposed as a possible way to achieve subthreshold swing much lower than the 60 mV/dec value.
  • Keywords
    MOSFET; semiconductor materials; MOSFET subthreshold swing; density-of-states; Clocks; Electrons; Gate leakage; Leakage current; MOSFET circuits; NIST; Physics; Power dissipation; Subthreshold current; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology Systems and Applications (VLSI-TSA), 2010 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    978-1-4244-5063-3
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2010.5488941
  • Filename
    5488941