DocumentCode
2701159
Title
On the 60 mV/dec @300 K limit for MOSFET subthreshold swing
Author
Cheung, Kin P.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2010
fDate
26-28 April 2010
Firstpage
72
Lastpage
73
Abstract
The 60 mV/dec limit for subthreshold swing at 300 K is generally considered a fundamental limit that cannot be defeated. The physical origin of this limit is revisited in this paper and the fact that this limit is in part determined by the density-of-states (DOS) of the source is highlighted. A scheme of engineering this DOS is proposed as a possible way to achieve subthreshold swing much lower than the 60 mV/dec value.
Keywords
MOSFET; semiconductor materials; MOSFET subthreshold swing; density-of-states; Clocks; Electrons; Gate leakage; Leakage current; MOSFET circuits; NIST; Physics; Power dissipation; Subthreshold current; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology Systems and Applications (VLSI-TSA), 2010 International Symposium on
Conference_Location
Hsinchu
ISSN
1524-766X
Print_ISBN
978-1-4244-5063-3
Electronic_ISBN
1524-766X
Type
conf
DOI
10.1109/VTSA.2010.5488941
Filename
5488941
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