A storage life modeling based on fuzzy stress-strength interface reliability model

System´s storage life modeling is a highly discussed topic in reliability field. The tradition methods of System´s storage life modeling include fault tree analysis, block diagram analysis and so on. In this article, we assume temperature as the main stress that should be considered and the strength of the system is the maximum temperature the system could bear. Under these assumptions, a new storage life modeling method is represented here to predict the system´s storage life. In the model, the operating process of the strength and stress is modeled based on fuzzy stress-strength interface (SSI) reliability model. The degradation process of is taken to be a gamma process .For an illustration of the proposed model, a simulated example is presented along with the associated computational result.