Title :
Impacts of multiple-gate configuration on characteristics of poly-Si nanowire SONOS devices
Author :
Hsu, Hsing-Hui ; Huang, Shuan-Yun ; Su, Chun-Jung ; Lin, Horng-Chih ; Huang, Tiao-Yuan
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this study, we have proposed a simple but novel way to fabricate poly-Si NW-SONOS devices. With a slight modification in the fabrication procedure, three types of devices having various gate configurations (SG, ΩG, and GAA) were successfully fabricated and characterized. The experimental results unambiguously show that, owing to the superior gate controllability over NW channels, much improved transfer characteristics are achieved with the GAA devices as compared with the other types of devices. Moreover, GAA devices also exhibit the best memory characteristics among all splits, highlighting the potential of such scheme for future SONOS applications.
Keywords :
elemental semiconductors; flash memories; nanoelectronics; nanowires; random-access storage; silicon; GAA devices; Si; gate-all-around structures; multiple gate configuration impact; omega-gate structures; polySi NW-SONOS devices; polySi nanowire SONOS device fabrication; side-gate structures; Anisotropic magnetoresistance; Controllability; Electronic mail; Etching; Fabrication; Laboratories; Nanoscale devices; SONOS devices; Temperature measurement; Voltage;
Conference_Titel :
VLSI Technology Systems and Applications (VLSI-TSA), 2010 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-5063-3
Electronic_ISBN :
1524-766X
DOI :
10.1109/VTSA.2010.5488955