Fault diagnosis for embedded read-only memories

Author

Mukherjee, N. ; Pogiel, A. ; Rajski, J. ; Tyszer, J.

Author_Institution

Mentor Graphics Corp., Wilsonville, OR, USA

fYear

2009

fDate

1-6 Nov. 2009

Firstpage

1

Lastpage

10

Abstract

The paper presents a BIST-based scheme for fault diagnosis that can be used to identify permanent and address independent failures in embedded read-only memories. The proposed approach offers a simple test flow and does not require intensive interactions between a BIST controller and a tester. The scheme rests on partitioning of rows and columns of the memory array by employing low cost test logic. It is designed to meet requirements of at-speed test thus enabling detection of time-related faults.

Keywords

built-in self test; failure analysis; fault diagnosis; read-only storage; BIST-based fault diagnosis scheme; address independent failures; at-speed test requirements; built-in self test; embedded read-only memory; memory array column partitioning; memory array row partitioning; permanent failures; test logic; time-related fault detection; Attenuation; Diffraction; Fault diagnosis; Geology; Microwave propagation; Nonuniform electric fields; Polarization; Propagation losses; Receiving antennas; Transmitting antennas;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2009. ITC 2009. International

Conference_Location

Austin, TX

Print_ISBN

978-1-4244-4868-5

Electronic_ISBN

978-1-4244-4867-8

Type

conf

DOI

10.1109/TEST.2009.5355530

Filename

5355530