Title :
Adhesion enhancement of underfill materials by silane additives
Author :
Yao, Qizhou ; Qu, Jianmin ; Wu, Jaili ; Wong, C.P.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In this paper, the fracture toughness of the interfaces between epoxy-based underfill materials and various substrates is experimentally measured. A small amount of silane coupling agent is added to the base underfill to form various underfill derivatives. Double layer specimens with pre-existing interfacial cracks are made for four-point bending tests. The substrates tested include aluminum, polyimide, BCB, and printed wiring boards (FR-4) with solder mask. The measurements are qualitatively correlated to each silane additive. Although the purpose of adding silane additives was to enhance the adhesion, it is found that the enhancement of interfacial toughness depends greatly on the type of substrate. The results of this study have important implications for flip-chip reliability, where interfacial cracking is one of the major failure modes
Keywords :
adhesion; bending; chip-on-board packaging; cracks; encapsulation; flip-chip devices; fracture toughness; integrated circuit packaging; integrated circuit reliability; materials testing; silicon compounds; Al; BCB substrates; FR-4 PWB substrates; SiH4; adhesion enhancement; aluminum substrates; base underfill; double layer specimens; epoxy-based underfill materials; failure modes; flip-chip reliability; four-point bending tests; interface fracture toughness; interfacial cracking; interfacial cracks; interfacial toughness; package substrates; polyimide substrates; printed wiring boards; silane additives; silane coupling agent; solder mask; underfill derivatives; underfill materials; Additives; Adhesives; Chemicals; Fatigue; Lead; Packaging; Pollution measurement; Stress; Testing; Thermomechanical processes;
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-56-4
DOI :
10.1109/ISAPM.1999.757282