• DocumentCode
    2701797
  • Title

    Polarization Properties of Planar Dielectric Lenses

  • Author

    Polemi, A. ; Maci, S.

  • Author_Institution
    Dept. of Inf. Eng., Siena Univ.
  • fYear
    2006
  • fDate
    9-14 July 2006
  • Firstpage
    3357
  • Lastpage
    3360
  • Abstract
    Composite planar dielectric structures used for increasing the directivity of a point source, have been investigated for many years. In earlier works, the effects of a superstrate with high permittivity, placed on a substrate with very low permittivity, have been studied. This substrate/superstrate structure was demonstrated to establish a resonance condition, which maximizes antenna gain, radiation resistance, and radiation efficiency. Particular attention has been given to the physical interpretation of this resonance gain effect, which can be described in terms of leaky waves (LW) excited in the structure. Under certain resonance conditions, a pair of weakly attenuated TE/TM leaky waves become the dominant contributions to the antenna aperture field. Although the demonstrated interest in such type of configurations, the polarization characteristics of the structure has not been investigated, yet. The aim of this paper is to rigorously demonstrate that the conventional choice of the stratification, not only ensures a large aperture field, but the same field is also well polarized when excited by any linearly polarized point source
  • Keywords
    dielectric devices; electromagnetic wave polarisation; leaky wave antennas; lens antennas; antenna aperture field; composite planar dielectric structures; leaky waves; linearly polarized point source; planar dielectric lenses; polarization properties; resonance gain effect; substrate structure; superstrate structure; Aperture antennas; Dielectric substrates; Frequency; Geometry; Lenses; Magnetic domains; Permittivity; Polarization; Resonance; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium 2006, IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    1-4244-0123-2
  • Type

    conf

  • DOI
    10.1109/APS.2006.1711333
  • Filename
    1711333