Title :
Voltage transient detection and induction for debug and test
Author :
Petersen, Rex ; Pant, Pankaj ; Lopez, Pablo ; Barton, Aaron ; Ignowski, Jim ; Josephson, Doug
Author_Institution :
Intel Corp., Hudson, MA, USA
Abstract :
Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.
Keywords :
circuit testing; transient analysis; circuit activity; debug and test; induction; voltage transient detection; Attenuation; Diffraction; Geology; Microwave propagation; Nonuniform electric fields; Polarization; Propagation losses; Receiving antennas; Testing; Voltage;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355542
