DocumentCode
2701870
Title
Near-field imaging and simultaneous charge detection with a semiconductor probe tip
Author
Hipp, Markus ; Mertz, Jerome ; Marti, O. ; Mlynek, Jaroslav
Author_Institution
Universitat Konstanz
fYear
1994
fDate
29 Aug-2 Sep 1994
Firstpage
110
Lastpage
111
Keywords
Dielectrics; Electromagnetic analysis; Electromagnetic propagation; Frequency; Lattices; Optical propagation; Optimized production technology; Photonic band gap; Photonic crystals; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 1994., Proceedings of 5th European
Print_ISBN
0-7803-1791-2
Type
conf
DOI
10.1109/EQEC.1994.698219
Filename
698219
Link To Document