Title :
Optimization of parametric yield: A tutorial
Author :
Director, S.W. ; Feldmann, Peter ; Krishna, K.
Abstract :
Yield loss can be characterized as either catastrophic or parametric. Catastrophic yield loss is primarily due to local, or spot, defects that occur in a manufacturing process. On the other hand, parametric yield loss is due to global disturbances, such as mask misalignment. In this paper we briefy eqdore these two different types of yield loss and then review some methods that have been developed to maximize parametric yield.
Conference_Titel :
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-0246-X
DOI :
10.1109/CICC.1992.589963
