Title :
Hierarchical yield estimation of large analog integrated circuits
Author :
Kurker, Christopher M. ; Paulos, John J. ; Gyurcsik, Ronald S. ; Lu, Jye-Chyi
Abstract :
A hierarchical methodology for parametric yield estimation is presented. The methodology employs a combination of behavioral and regression modeling. Three related techniques for hierarchical yield estimation are demonstrated on a large BiCMOS circuit combining discrete-time and continuous-time operation.
Conference_Titel :
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-0246-X
DOI :
10.1109/CICC.1992.589964
