DocumentCode
2702150
Title
Compression based on deterministic vector clustering of incompatible test cubes
Author
Mrugalski, G. ; Mukherjee, N. ; Rajski, J. ; Czysz, D. ; Tyszer, J.
Author_Institution
Mentor Graphics Corp., Wilsonville, OR, USA
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
10
Abstract
The presented compression scheme is a novel solution that is based on deterministic vector clustering and encompasses three data reduction features in one on-chip decoding system. The approach preserves all benefits of continuous flow decompression and offers compression ratios of order 1000x with encoding efficiency much higher than 1.00.
Keywords
circuit testing; data compression; decoding; electronic engineering computing; pattern clustering; compression scheme; continuous flow decompression; data reduction features; deterministic vector clustering; incompatible test cubes; on-chip decoding system; Automatic test pattern generation; Bandwidth; Broadcasting; Circuit testing; Compaction; Costs; Decoding; Encoding; Graphics; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355555
Filename
5355555
Link To Document