• DocumentCode
    2702152
  • Title

    A new SLM OFDM scheme with low complexity for PAPR reduction in CR system

  • Author

    Xin, Liu ; Qihui, Wu ; Yang, Yang

  • Author_Institution
    PLA Univ. of Sicence & Technol., Nanjing, China
  • fYear
    2010
  • fDate
    Aug. 28 2010-Sept. 3 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The ever growing demand for wireless services has placed enormous burden on valuable resources such as spectral bandwidth. Cognitive Radio (CR) with dynamic access is becoming the main trend of the next generation wireless communication system as it can greatly increase the efficiency of spectrum utilization. OFDM, which can allocate spectrum resource conveniently, is the main modulation scheme of CR. Recently, OFDMA has been adopted by IEEE802.22 Wireless Regional Area Network (WRAN) as the transmission technique of physics layer and multi-address access technique. However, high peak-to-average power ratio (PAPR) of signal is a major problem of OFDM system. High peak value would result in distortion of signals for the non-linearity of power amplifier, which would create interference to licensed users.
  • Keywords
    OFDM modulation; cognitive radio; frequency division multiple access; interference (signal); power amplifiers; radio spectrum management; spectral analysis; wireless LAN; CR system; IEEE802.22 wireless regional area network; OFDMA; PAPR reduction; SLM OFDM scheme; WRAN; cognitive radio; dynamic access; high peak-to-average power ratio; interference; low complexity; main modulation scheme; multiaddress access technique; next generation wireless communication system; power amplifier; spectral bandwidth; spectrum resource allocation; spectrum utilization; transmission technique; wireless services; Complexity theory; Partial transmit sequences; Peak to average power ratio; Simulation; Time domain analysis; Transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Information Technology and Systems (ICWITS), 2010 IEEE International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-7091-4
  • Type

    conf

  • DOI
    10.1109/ICWITS.2010.5611962
  • Filename
    5611962