Title :
Electromagnetic interferences caused by the common-mode noises from stacked I/O connectors and their treatments
Author :
Kuo, Li-Ruei ; Chou, Hsi-Tseng ; Lee, Yung-Sen ; Chou, Hsi-Hsir
Author_Institution :
Commun. Res. Center, Yuan Ze Univ., Chungli, Taiwan
fDate :
Aug. 28 2010-Sept. 3 2010
Abstract :
The electromagnetic interferences (EMI) caused by noises resulted from the common mode of stacked I/O connectors are analyzed using both numerical simulations and experimental measurements. A strategy is presented to suppress the noise level and its emission as well, which is found to be very effective as shown in our examination.
Keywords :
electric connectors; electromagnetic interference; EMI; common-mode noises; electromagnetic interferences; stacked I/O connectors; Electromagnetic interference; Electromagnetics; Magnetic fields; Noise; Numerical simulation; Pins;
Conference_Titel :
Wireless Information Technology and Systems (ICWITS), 2010 IEEE International Conference on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-7091-4
DOI :
10.1109/ICWITS.2010.5611967
