DocumentCode :
2702422
Title :
Wafer level and substrate level chip scale packaging
Author :
Young, James L.
Author_Institution :
Intarsia Corp., Fremont, CA, USA
fYear :
1999
fDate :
14-17 Mar 1999
Firstpage :
232
Lastpage :
235
Abstract :
Wafer level chip scale packaging (CSP) is gaining more momentum as a low cost, high performance solution for portable products. The design demands for portable products is particularly difficult since the designer must find solutions that provide a smaller footprint and higher performance, but at the same time must be cost competitive with current packaging offerings. To date, the fine pitch BGA style of chip scale packages have not offered the cost needed for these low I/O products. The wafer level CSPs do provide the cost advantage with the promise of continued cost reduction in the future. There are a number of different wafer level CSPs currently in the market. This paper addresses wafer level CSP development for integrated passives developed for both silicon wafers and large area glass panels (350 mm×400 mm)
Keywords :
capacitors; cellular radio; chip scale packaging; inductors; resistors; surface mount technology; 350 mm; 400 mm; CSP; Si; cell phones; chip scale packages; cost competitiveness; cost reduction; design; fine pitch BGA; integrated passives; large area glass panels; package footprint; package performance; packaging; portable products; product I/O; silicon wafers; substrate level chip scale packaging; wafer level CSP development; wafer level CSPs; wafer level chip scale packaging; Cellular phones; Chip scale packaging; Costs; Glass; Manufacturing; Product design; Radio frequency; Silicon; Substrates; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-56-4
Type :
conf
DOI :
10.1109/ISAPM.1999.757318
Filename :
757318
Link To Document :
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