• DocumentCode
    2702463
  • Title

    A user-friendly dependability evaluation tool

  • Author

    Hecht, Herbert ; Tai, Ann T. ; Trivedi, Kishor S. ; Chruscicki, Andrew J.

  • Author_Institution
    SoHaR Incorp., Beverly Hills, CA, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 May 1996
  • Firstpage
    637
  • Abstract
    In order to permit users with little analytic background to evaluate dependability, modeling tools require a user-friendly front end. With this motivation, we have developed a software tool referred to as SDDS for “Software Dependability for Distributed Systems.” In particular, we have designed and implemented a graphical user interface (GUI) based on a “user-language”-basic building blocks representing system components and/or subsystems. Therefore, the user can specify his/her dependability model at a high level. SDDS then translates the high-level specification into a representation that can be automatically solved by the underlying modeling engines SHARPE or SPNP (both from Trivedi, a Professor at Duke University). The translation and solution processes are transparent to the user. We first illustrate the design of SDDS. We then describe, from a software engineering perspective, how SDDS can be utilized effectively for evaluation and improvement of system design
  • Keywords
    distributed processing; graphical user interfaces; hierarchical systems; reliability theory; software engineering; software performance evaluation; software tools; GUI; SHARPE; SPNP; Trivedi; dependability model; graphical user interface; high-level specification; modeling tools; modelling engines; representation; software engineering; software tool; translation; user-friendly dependability evaluation tool; user-friendly front end; user-language; Contracts; Engines; Graphical user interfaces; Laboratories; Mathematical model; Performance analysis; Protocols; Software performance; Software tools; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1996. NAECON 1996., Proceedings of the IEEE 1996 National
  • Conference_Location
    Dayton, OH
  • ISSN
    0547-3578
  • Print_ISBN
    0-7803-3306-3
  • Type

    conf

  • DOI
    10.1109/NAECON.1996.517717
  • Filename
    517717