Title :
Dependence of external optical feedback sensitivity on structural parameters of DFB semiconductor lasers
Author :
Alam, Mohammad F. ; Karim, Mohammad A. ; Islam, Saiful
Author_Institution :
Center for Electro-Opt., Dayton Univ., OH, USA
Abstract :
External optical feedback sensitivity in distributed feedback (DFB) semiconductor lasers is analyzed in this paper with special attention to phase-shifted and complex-coupled lasers. The effects of variations of structural parameters such as index and/or gain coupling strengths, facet reflectivities, and corrugation phase angles on external optical feedback sensitivity are studied. Quarter-wave-shifted index-coupled DFB lasers exhibit low external optical feedback sensitivity for large index coupling coefficients and high facet reflectivities. Pure gain-coupled DFB lasers perform better than the uniform index-coupled DFB lasers without any phase-shifting structure but worse than λ/4 phase-shifted index-coupled lasers with high coupling strengths. External optical feedback sensitivity of complex-coupled lasers is a sensitive function of the structural parameters and varies significantly with the index-to-gain coupling ratio and the total coupling. Presence of a small amount of index coupling relative to the gain coupling in a gain-coupled laser improves the external optical feedback sensitivity
Keywords :
distributed feedback lasers; laser feedback; laser stability; semiconductor lasers; DFB semiconductor lasers; complex-coupled lasers; corrugation phase angles; distributed feedback semiconductor lasers; external optical feedback sensitivity; facet reflectivities; gain-coupled DFB lasers; high facet reflectivities; phase-shifted lasers; quarter-wave-shifted index-coupled DFB lasers; structural parameters; Distributed feedback devices; Laser feedback; Laser modes; Laser noise; Optical coupling; Optical feedback; Optical noise; Optical sensors; Reflectivity; Semiconductor lasers;
Conference_Titel :
Aerospace and Electronics Conference, 1996. NAECON 1996., Proceedings of the IEEE 1996 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-3306-3
DOI :
10.1109/NAECON.1996.517722