Title :
Development of RCS simulation software for electrically large complex cavities based on the secondary development of UG
Author :
Li Jianzhou ; Jiang Yingfu ; Xu Jiadong
Author_Institution :
Sch. of Electron. & Inf., Northwestern Polytech. Univ., Xi´an, China
Abstract :
A shooting and bouncing ray (SBR) based software is developed by the secondary development of Unigraphics (UG). The core algorithm of ray tracing is based on the optimized non-uniform rational B-splines (NURBS) curve-surface intersection algorithm built in UG, which results in very high accuracy of ray path tracing without meshing, thus keeping the accuracy of the original cavity model. It is also efficient even if work with a complex cavities because of avoiding of shielding process. Both geometry modeling of cavity and its scattering simulation are integrated into a uniform platform, which forms an easy-using integrative and universal environment for electromagnetic modeling of complex cavities. In this paper, the developed software for complex cavity scattering modeling has been introduced with some numerical results to demonstrate the accuracy and efficiency.
Keywords :
computational electromagnetics; radar cross-sections; ray tracing; solid modelling; splines (mathematics); NURBS curve-surface intersection; RCS simulation software; complex cavity scattering modeling; electrically large complex cavities; electromagnetic modeling; geometry modeling; nonuniform rational B-splines; radar cross section; ray path tracing; shooting and bouncing ray based software; unigraphics; Electromagnetic modeling; Electromagnetic scattering; Geometry; Optical scattering; Radar scattering; Ray tracing; Solid modeling; Spline; Surface reconstruction; Surface topography; Radar Cross Section; electrically large complex cavit; ray-tracing; secondary development of UG; shooting and bouncing rays (SBR);
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4076-4
DOI :
10.1109/MAPE.2009.5355577