Abstract :
The author describes how design, manufacturing, and test can join forces, and collaborate to battle the nanometer challenges in the semiconductor industry.
Keywords :
design for manufacture; design for testability; integrated circuit manufacture; integrated circuit testing; nanoelectronics; design-aware test; lithography; manufacturing-aware test; microbridges; semiconductor industry; test patterns;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
DOI :
10.1109/TEST.2009.5355581
