Title :
Thermal analysis of multi-chip LED package with different position and ambient temperatures
Author :
Lee, Sze-Yen ; Devarajan, Mutharasu
Author_Institution :
Sch. of Phys., Univ. Sains Malaysia, Minden, Malaysia
Abstract :
Junction temperature and thermal resistance are important factors in determining the overall performance of LED packages. Thermal transient measurements of multi-chip high brightness LED package with two specified positions under various ambient temperatures are discussed in this paper. Case 1 and case 2 are introduced as the inclined angle of the package at 0° and 90°. The main goal is to study the thermal characteristics of the LED package at different degree of inclinations using thermal transient tester (T3ster). Experimental results on junction temperature and thermal resistance for both cases at different ambient temperature are presented. From the obtained structure functions, results shows that the position of an LED package would influence the heat transfer of the whole LED package.
Keywords :
integrated optoelectronics; light emitting diodes; multichip modules; thermal analysis; ambient temperature; junction temperature; multichip LED package; multichip high brightness LED package; thermal analysis; thermal resistance; thermal transient tester; Educational institutions; Heating; Large Hadron Collider; Light emitting diodes; Thermal factors; Thermal resistance; Transient analysis; High brightness LED package; ambient temperature; junction temperature; structure function; thermal resistance;
Conference_Titel :
Photonics (ICP), 2011 IEEE 2nd International Conference on
Conference_Location :
Kata Kinabalu
Print_ISBN :
978-1-61284-265-3
Electronic_ISBN :
978-1-61284-263-9
DOI :
10.1109/ICP.2011.6106866