DocumentCode :
2703058
Title :
A compact closed-loop nanomanipulation system in scanning electron microscope
Author :
Zhang, Yan Liang ; Zhang, Yong ; Ru, Changhai ; Woo, Patrick ; Nakamura, Mitsuhiro ; Hoyle, David ; Cotton, Ian ; Sun, Yu
Author_Institution :
Adv. Micro & Nanosyst. Lab., Univ. of Toronto, Toronto, ON, Canada
fYear :
2011
fDate :
9-13 May 2011
Firstpage :
3157
Lastpage :
3162
Abstract :
This paper presents a nanomanipulation system for operation inside scanning electron microscopes (SEM). The system is small in size, capable of being mounted onto and demounted from an SEM through the specimen exchange chamber without breaking the high vacuum of the SEM. This advance eliminates frequent opening of the high-vacuum chamber, thus, incurs less contamination to the SEM, avoids lengthy pumping, and significantly eases the exchange of end-effectors (e.g., nano probes and grippers). The system consists of two independent 3-DOF Cartesian nanomanipulators based on piezo motors and piezo actuators. High-resolution optical encoders are integrated into the nanomanipulators to provide position feedback for closed-loop control. A look-then-move control system and a contact detection algorithm are implemented for horizontal and vertical nanopositioning. The system design, system characterization details, and system performance are described.
Keywords :
closed loop systems; end effectors; nanopositioning; piezoelectric actuators; piezoelectric motors; scanning electron microscopes; SEM; closed loop control; closed loop nanomanipulation system; contact detection algorithm; end effector; high-resolution optical encoder; high-vacuum chamber; horizontal nanopositioning; independent three-DOF Cartesian nanomanipulator; look-then-move control system; piezoactuator; piezomotor; position feedback; scanning electron microscope; specimen exchange chamber; vertical nanopositioning; Accuracy; Actuators; Imaging; Noise; Servomotors; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation (ICRA), 2011 IEEE International Conference on
Conference_Location :
Shanghai
ISSN :
1050-4729
Print_ISBN :
978-1-61284-386-5
Type :
conf
DOI :
10.1109/ICRA.2011.5980493
Filename :
5980493
Link To Document :
بازگشت