• DocumentCode
    2703142
  • Title

    An algorithm for an advanced GTEM to ground plane correlation of radiated emission test

  • Author

    Lee, Ae-Kyoung

  • Author_Institution
    Radio Sci. Section, Electron. & Telecommun. Res. Inst., Taejeon, South Korea
  • fYear
    1996
  • fDate
    19-23 Aug 1996
  • Firstpage
    58
  • Lastpage
    62
  • Abstract
    This paper proposes a new algorithm for radiated emission test correlation between a gigahertz transverse electromagnetic (GTEM) cell and a facility with a ground plane (GP) as open area test sites or semi-anechoic chambers. An unknown source object is regarded as equivalent electric and magnetic dipoles. The far field that is radiated from the dipoles over a GP, is evaluated and correlated with measured powers at the output port of a GTEM cell wherein the object exists. This algorithm considers the relative phases of dipole moments and requires fifteen orientations of a test object. The fields radiated from a notebook computer were measured and several theoretical simulations were performed to analyze accuracy of the proposed algorithm
  • Keywords
    UHF measurement; anechoic chambers; computer equipment testing; correlation methods; electromagnetic fields; electromagnetic interference; electronic equipment testing; notebook computers; test facilities; GTEM cell; algorithm accuracy; dipole moments; equivalent electric dipoles; equivalent magnetic dipoles; gigahertz transverse electromagnetic cell; ground plane correlation; measured power; notebook computer; open area test sites; output port; radiated emission test; radiated emission test correlation; radiated far field; relative phases; semianechoic chambers; simulations; source object; test object; Analytical models; Computational modeling; Computer simulation; Electromagnetic measurements; Electromagnetic radiation; Magnetic field measurement; Magnetic moments; Open area test sites; TEM cells; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3207-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.1996.561201
  • Filename
    561201