DocumentCode :
2703360
Title :
S2P: a stable 2-pole RC delay and coupling noise metric [IC interconnects]
Author :
Acar, Emrah ; Odabasioglu, Altan ; Celik, Mustafa ; Pileggi, Lawrence T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1999
fDate :
4-6 Mar 1999
Firstpage :
60
Lastpage :
63
Abstract :
The Elmore delay is the metric of choice for performance-driven design applications due to its simple, explicit form and ease with which sensitivity information can be calculated. However, for deep submicron technologies, the accuracy of the Elmore delay is insufficient. In this paper we formulate a delay model using a provably stable two pole waveform response that provides a unique mapping between four moments and a specific delay value. Unlike traditional moment matching, this two-pole model permits us to precharacterize the delays, and store them in a table, as a mapped function of three parameters. The model also provides an explicit expression for the peak noise induced on a coupled line as a function of the same three moments. The results indicate runtimes comparable to an Elmore delay calculation but with the accuracy of an AWE approximation
Keywords :
RC circuits; VLSI; approximation theory; circuit analysis computing; delay estimation; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; numerical stability; S2P; VLSI circuits; coupled line; deep submicron technologies; delay model; mapped function; peak noise; performance-driven design applications; stable 2-pole RC delay metric; stable coupling noise metric; stable two pole waveform response; two-pole model; Admittance; Application software; Circuit synthesis; Electrical resistance measurement; Integrated circuit interconnections; Propagation delay; Runtime; Semiconductor device noise; Table lookup; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 1999. Proceedings. Ninth Great Lakes Symposium on
Conference_Location :
Ypsilanti, MI
ISSN :
1066-1395
Print_ISBN :
0-7695-0104-4
Type :
conf
DOI :
10.1109/GLSV.1999.757377
Filename :
757377
Link To Document :
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