DocumentCode
2703379
Title
Integrated varistor-capacitor ceramics
Author
Toal, F.J. ; Dougherty, J.P. ; Randall, C.A.
Author_Institution
Intercoll. Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Volume
2
fYear
1996
fDate
18-21 Aug 1996
Firstpage
593
Abstract
There exists a continued trend of ceramic integration in electronic components. In the last decade inductor-capacitors, resistor-capacitors have all successfully undergone integration into surface mount components. There exists a need to integrate varistors and capacitors to suppress high frequency transient voltage surges beyond ⩾0.5 ns. The successful co-firing of a varistor and capacitor depends on the careful matching of thermal expansion co-efficients, total densification and shrinkage rates of the respective materials. It is also important that interfacial reactions be reduced or eliminated through design or materials selection. Hence, this work describes attempts to co-fire a ZnO-Bi2O3-CoO based varistor and a relaxor based Pb(Mg1/3Nb2/3)O3-Pb(Zn1/3Nb 2/3)O3 capacitor. Both compositions share similar thermal co-efficients which significantly reduces the potential for cracking on cooling. By careful control of the composition the total densification and shrinkage rates were matched to that of the varistor. The interfacial microstructures, relevant I-V and dielectric measurements are also discussed
Keywords
ceramic capacitors; densification; lead compounds; shrinkage; surface mount technology; thermal expansion; varistors; zinc compounds; I-V characteristics; PMN-PZN; PbMgNbO3-PbZnNbO3; ZnO; ZnO-Bi2O3-CoO; ceramic integration; co-firing; densification; dielectric properties; interfacial reaction; microstructure; relaxor; shrinkage; surface mount component; thermal expansion coefficient; transient voltage surge suppression; varistor-capacitor; Capacitors; Ceramics; Cooling; Electronic components; Frequency; Niobium; Surges; Thermal expansion; Varistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location
East Brunswick, NJ
Print_ISBN
0-7803-3355-1
Type
conf
DOI
10.1109/ISAF.1996.598051
Filename
598051
Link To Document