Title :
Power scan: DFT for power switches in VLSI designs
Author :
Bing-Chuan Bai ; Li, Chien-Mo ; Kifli, Augusli ; Tsai, Even ; Wu, Kun-Cheng
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This poster presents Power Scan, a design-for-testability for power switches in VLSI designs. It measures IR drop in function mode and detects leakage current in sleep mode. Power Scan reduces the test cost at the price of small area overhead.
Keywords :
VLSI; analogue-digital conversion; comparators (circuits); design for testability; integrated circuit design; leakage currents; power electronics; switches; IR drop; Power Scan; VLSI designs; analog-to-digital converter; comparators; design-for- testability; function mode; leakage current; power switches; sleep mode; Computer architecture; Costs; Energy consumption; Infrared detectors; Leak detection; Leakage current; Testing; Threshold voltage; Variable structure systems; Very large scale integration;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355631
