DocumentCode :
2703655
Title :
Performance enhancements in Edquad plastic packages
Author :
Karnezos, Marcos ; Chidambaram, N. ; Goetz, Martin ; Chang, S.C. ; Ahn, S.H. ; Tak, Chu Ming ; Reyes, Pinky
Author_Institution :
ASAT Inc., Palo Alto, CA, USA
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
845
Lastpage :
850
Abstract :
The widespread use of plastic packages has extended into applications that require thermal and electrical performance not possible with the conventional packages. Edquad is a family of packages that provides up to 50% increase in power dissipation and significant reduction in electrical parasitics yet it is available in JEDEC standard body sizes in MQFP, TQFP, PLCC and SOIC formats with the heatspreader up or down. The packages have an integral heatspreader that carries most of the heat from the die attached directly on the bottom side, to the top which is exposed to the ambient. The heatspreader is also used as an electrical ground plane and the conventional die paddle is etched out to provide an internal power or ground ring. This arrangement provides for significant design flexibility to the device designer and has been demonstrated to result in lower package parasitics and higher clock frequency operation. The materials, the heatspreader design and surface preparation have been chosen to maximize adhesion and minimize stress at the interfaces. As a result these packages meet and exceed the accepted reliability standards of plastic packages
Keywords :
adhesion; cooling; integrated circuit packaging; integrated circuit reliability; plastic packaging; Edquad plastic packages; JEDEC standard body sizes; MQFP; PLCC; SOIC; TQFP; adhesion; clock frequency operation; design flexibility; electrical ground plane; electrical parasitics; electrical performance; integral heatspreader; package parasitics; power dissipation; reliability standards; surface preparation; thermal performance; Assembly; Ceramics; Conducting materials; Copper; Etching; Plastic packaging; Polyimides; Power dissipation; Standards organizations; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.517786
Filename :
517786
Link To Document :
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