IEEE P1687 IJTAG a presentation of current technology

Author

Posse, K. ; Crouch, Andrew ; Rearick, J.

fYear

2009

fDate

1-6 Nov. 2009

Firstpage

1

Lastpage

1

Abstract

The use of embedded test instrumentation in ASIC designs has changed dramatically over the last decade. This is due to a variety of forces that affect the semiconductor industry. Unfortunately, processes surrounding test creation and validation this instrumentation has become significantly more complicated in recent years. IEEE P1687, which is now nearing completion and ballot, addresses these issues and makes the access and control of embedded instruments nearly automatic. This poster session will illustrate the latest innovations in the standard.

Keywords

IEEE standards; application specific integrated circuits; built-in self test; design for testability; electronic engineering computing; hardware description languages; high level languages; integrated circuit design; integrated circuit testing; ASIC designs; DFT; IEEE P1687; IJTAG; dynamic scan chain lengths; embedded test instrumentation; hardware description language; instrument access network; logical mapping function specification; procedure description language; Application specific integrated circuits; Automatic testing; Circuit testing; Design for testability; Electronics industry; Hardware design languages; Instruments; Logic testing; Page description languages; Technological innovation;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2009. ITC 2009. International

Conference_Location

Austin, TX

Print_ISBN

978-1-4244-4868-5

Electronic_ISBN

978-1-4244-4867-8

Type

conf

DOI

10.1109/TEST.2009.5355639

Filename

5355639