• DocumentCode
    2703758
  • Title

    Influence of freon on charge density build-up in a solid insulator

  • Author

    Elkhodary, S.M. ; Hackam, R.

  • Author_Institution
    Dept. of Electr. Eng., Windsor Univ., Ont., Canada
  • fYear
    1994
  • fDate
    5-8 Jun 1994
  • Firstpage
    550
  • Lastpage
    553
  • Abstract
    The charge generation at the surface of and within an acrylic glass spacer was measured using a capacitive probe in freon as a function of gas pressure and the level, duration and polarity of a dc applied voltage. Typically the rate of charge build up increased with increasing gas pressure from 0.174 μC/m2/s at 0.1 MPa to 0.97 μC/m2/s at 0.4 MPa a fixed applied voltage of 80 kV. At a fixed gas pressure of 0.1 MPa the charge build up increased from 2.6×10-3 μC/m2/s at 2 kV to 174×10 -3 μC/m2/s at 80 kV. The saturated charge density increased linearly with increasing voltage from 1.3 μC/m2 at 2 kV to 61.2 μC/m2 at 80 kV, for 0.1 MPa. The charging current was also monitored and found to decrease rapidly with increasing time until saturation is reached. The saturated current increased, at a fixed pressure, with increasing voltage. It also increased with increasing pressure at a fixed applied voltage. The observed charge build up is governed by the total surface and volume resistances of the insulator
  • Keywords
    organic insulating materials; surface charging; 0.1 to 0.4 MPa; 2 to 80 kV; DC applied voltage; acrylic glass spacer; capacitive probe; charge density build-up; charging current; freon; saturation; solid insulator; surface resistance; volume resistance; Charge measurement; Current measurement; DC generators; Glass; Insulation; Monitoring; Pressure measurement; Probes; Solids; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1994., Conference Record of the 1994 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-1942-7
  • Type

    conf

  • DOI
    10.1109/ELINSL.1994.401396
  • Filename
    401396