DocumentCode :
2703799
Title :
Accurate measurement of small delay defect coverage of test patterns
Author :
Prasanna, Narendra Devta ; Goel, Sandeep Kumar ; Gunda, Arun ; Ward, Mark ; Krishnamurthy, Prabhakaran
Author_Institution :
LSI Corp., Milpitas, CA, USA
fYear :
2009
fDate :
1-6 Nov. 2009
Firstpage :
1
Lastpage :
10
Abstract :
Small delay defect (SDD) testing is expected to become more prevalent as technology nodes continue to shrink and design frequencies continue to increase. In this paper, we critically examine previously published methods for evaluating SDD coverage and identify their shortcomings as an accurate and practical coverage metric. We propose an accurate method for measuring the coverage of small delay defects by any given pattern set. We demonstrate that the proposed metric overcomes the identified shortcomings of previously published approaches. For several ISCAS and industrial circuits, we generate test patterns and compare their SDD coverage values using different methods. Experimental results also demonstrate that the proposed method is several times faster to compute. Finally, we evaluate different testing strategies for screening small delay defects.
Keywords :
delays; integrated circuit testing; ISCAS; accurate measurement; industrial circuits; small delay defect; test patterns; Automatic test pattern generation; Circuit faults; Circuit testing; Clocks; Fault detection; Frequency; Hazards; Integrated circuit measurements; Large scale integration; Propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
Type :
conf
DOI :
10.1109/TEST.2009.5355644
Filename :
5355644
Link To Document :
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