• DocumentCode
    2703844
  • Title

    Burn-in modeling - The application of theory to burn-in and field data

  • Author

    Huston, Hance H. ; Wood, Michael H. ; DePalma, Vincent M.

  • fYear
    1992
  • fDate
    3-6 May 1992
  • Abstract
    Sciniconductor chip reliability is commonly improved through burn-in. The theory of burn-in modcling and statistics is describcd and applicd to scvcral CRSC studies using actual field data. Analysis of ficld data validates or estimates the burn-in paramcters for each product.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-0246-X
  • Type

    conf

  • DOI
    10.1109/CICC.1992.591327
  • Filename
    5727375
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2703844