Title :
Burn-in modeling - The application of theory to burn-in and field data
Author :
Huston, Hance H. ; Wood, Michael H. ; DePalma, Vincent M.
Abstract :
Sciniconductor chip reliability is commonly improved through burn-in. The theory of burn-in modcling and statistics is describcd and applicd to scvcral CRSC studies using actual field data. Analysis of ficld data validates or estimates the burn-in paramcters for each product.
Conference_Titel :
Custom Integrated Circuits Conference, 1992., Proceedings of the IEEE 1992
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-0246-X
DOI :
10.1109/CICC.1992.591327
